Materials Science of Semiconductors Laboratory
Lecture, 30 minutes; discussion, 30 minutes; laboratory, two hours; outside study, three hours. Enforced corequisite: course 121. Experiments conducted on materials characterization, including measurements of contact resistance, dielectric constant, and thin film biaxial modulus and CTE. Letter grading.
Select an instructor
Goorsky, M.S. and Pan, K. (Spring 2024)
Carson, B.S. and Goorsky, M.S. (Spring 2023)
Mark S. Goorsky (Spring 2022)
Liao, M.E. and Goorsky, M.S. (Spring 2022)
Mark S. Goorsky and Michael Liao (Spring 2021)
Mark S. Goorsky and Eva Rosker (Spring 2021)
Dwight Streit et al. (Spring 2017)
Mark S. Goorsky and Chao Li (Spring 2016)
Mark S. Goorsky and Tingyu Bai (Spring 2016)
Mark S. Goorsky et al. (Spring 2015)
Mark S. Goorsky et al. (Spring 2014)
Mark S. Goorsky et al. (Spring 2013)
Goorsky, M.S. et al. (Spring 2012)
Goorsky, M.S. and Jackson, M.J. (Spring 2011)
Goorsky, M.S. and Fong, D.M. (Spring 2011)
Goorsky, M.S. et al. (Spring 2010)
Goorsky, M.S. et al. (Spring 2009)
Pangan, A. et al. (Spring 2008)
Poust, S.L. et al. (Spring 2007)
Hayashi, S.L. et al. (Spring 2006)
Hayashi, S.L. and Miclaus, C.V. (Spring 2005)
Xu, Y. and Wu, A.T. (Spring 2003)
Xu, Y. and Gan, H. (Spring 2002)
Goorsky, M.S. and Pan, K.
24S
Carson, B.S. and Goorsky, M.S.
23S
Mark S. Goorsky
22S
Liao, M.E. and Goorsky, M.S.
22S
Mark S. Goorsky and Michael Liao
21S
Mark S. Goorsky and Eva Rosker
21S
Dwight Streit et al.
17S
Mark S. Goorsky and Chao Li
16S
Mark S. Goorsky and Tingyu Bai
16S
Mark S. Goorsky et al.
15S
Mark S. Goorsky et al.
14S
Mark S. Goorsky et al.
13S
Goorsky, M.S. et al.
12S
Goorsky, M.S. and Jackson, M.J.
11S
Goorsky, M.S. and Fong, D.M.
11S
Goorsky, M.S. et al.
10S
Goorsky, M.S. et al.
09S
Pangan, A. et al.
08S
Poust, S.L. et al.
07S
Hayashi, S.L. et al.
06S
Hayashi, S.L. and Miclaus, C.V.
05S
Xu, Y. and Wu, A.T.
03S
Xu, Y. and Gan, H.
02S
Previously taught
24S
23S
Grade distributions not available.