Introduction to Materials Characterization A (Crystal Structure, Nanostructures, and X-Ray Scattering)

Lecture, four hours; discussion, one hour; outside study, seven hours. Enforced requisite: course 104. Modern methods of materials characterization; fundamentals of crystallography, properties of X rays, X-ray scattering; powder method, Laue method; determination of crystal structures; phase diagram determination; high-resolution X-ray diffraction methods; X-ray spectroscopy; design of materials characterization procedures. Letter grading.

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Instructor
Mark S. Goorsky
Previously taught
20F 17F 16F